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Deep learning for the identification of autism traits in children through facial expressions: a systematic review

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 15 No. 3 (2025)

DOI
10.11591/ijece.v15i3.pp3279-3290
ISSN
2722-2578, 2088-8708
Published
2025-06-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

This study employs a bibliometric analysis to examine research on the application of artificial intelligence, specifically deep learning, in the detection of autism traits through facial expressions. Using quantitative methodologies. The analysis revealed a notable growth in scientific output from 2019, with an emphasis on techniques such as convolutional neural networks and systems based on the facial action coding system (FACS- CNN). The results highlight improvements in diagnostic accuracy thanks to the use of deep learning, although challenges related to data quality and availability remain. This study underscores the importance of international collaboration and technological innovation to advance the diagnosis and treatment of autism, offering a comprehensive perspective on current and future trends in this interdisciplinary field.

Collaboration network of the authors

11 authors · 24 co-authorship links · 1 across different organisations

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  • Universidad Tecnológica del Perú
  • AGH University of Krakow
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
Show as table
Co-authorOrganisationJoint articles
Leonardo Ledesma OrtechoUniversidad Tecnológica del Perú2
Enrique Romero JoséUniversidad Tecnológica del Perú2
Ernesto Paiva-PeredoUniversidad Tecnológica del Perú1
Diego Gonzales-RodriguezUniversidad Tecnológica del Perú1
William Trujillo HerreraUniversidad Tecnológica del Perú1
Juan J. SoriaUniversidad Tecnológica del Perú1
Diana Quispe-ArpasiUniversidad Tecnológica del Perú1
J. H. CorreaAGH University of Krakow1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Deep learning for the identification of autism traits in children through facial expressions: a systematic review</dc:title><dc:creator>Palomino, Daniella Romani</dc:creator><dc:creator>Ovalle, Christian</dc:creator><dc:creator>Cordova-Berona, Heli</dc:creator><dc:description>&lt;jats:p&gt;This study employs a bibliometric analysis to examine research on the application of artificial intelligence, specifically deep learning, in the detection of autism traits through facial expressions. Using quantitative methodologies. The analysis revealed a notable growth in scientific output from 2019, with an emphasis on techniques such as convolutional neural networks and systems based on the facial action coding system (FACS- CNN). The results highlight improvements in diagnostic accuracy thanks to the use of deep learning, although challenges related to data quality and availability remain. This study underscores the importance of international collaboration and technological innovation to advance the diagnosis and treatment of autism, offering a comprehensive perspective on current and future trends in this interdisciplinary field.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2025-06-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v15i3.pp3279-3290</dc:identifier><dc:identifier>10.11591/ijece.v15i3.pp3279-3290</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 15 No 3 (2025); 3279</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>https://ijece.iaescore.com/index.php/IJECE/article/viewFile/37188/18281</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>