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Facial image analysis for autism spectrum disorder detection in toddlers using deep learning and transfer learning

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 15 No. 5 (2025)

DOI
10.11591/ijece.v15i5.pp4856-4864
ISSN
2722-2578, 2088-8708
Published
2025-10-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Autism spectrum disorder (ASD) is a neurological illness that manifests itself through restricted and repeated activity patterns, frivolous or recidivist interests or hobbies and consistent handicaps to social interactions and exchanges. Better results and early intervention are dependent upon the early identification of people with ASD. Doctors employ a variety of techniques to anticipate autism, including genetic testing, neuropsychological testing, hearing and vision screenings, and diagnostic interviews. In addition to requiring more time and money, the traditional diagnosis approach makes the parents of children with extensive developmental abnormalities feel too inadequate to disclose their condition. So, we need a tool that can detect autism early in less time and money. Machine learning methods can be used to fulfill this criterion. In this study, deep learning with transfer learning (VGG-16) is used to detect autism through facial images of children and achieved almost 97% accuracy. The suggested model significantly improves accuracy and saves time and money by using face features in photos of children to identify early autism tendencies in children.

Collaboration network of the authors

9 authors · 12 co-authorship links · 4 across different organisations

Hover or tap a name to highlight its co-authors. Double-click to open the author's page.

  • KIIT University
  • Indian Institute of Technology Kharagpur
  • C.V. Raman Global University
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
Show as table
Co-authorOrganisationJoint articles
Souvik PalKIIT University2
Sharmistha RoyKIIT University2
Rajib MallIndian Institute of Technology Kharagpur2
Suneeta MohantyKIIT University2
G. B. MundKIIT University1
Surendra Kumar NandaC.V. Raman Global University1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Facial image analysis for autism spectrum disorder detection in toddlers using deep learning and transfer learning</dc:title><dc:creator>Das, Anupam</dc:creator><dc:creator>Pattnaik, Prasant Kumar</dc:creator><dc:creator>Bandyopadhyay, Anjan</dc:creator><dc:description>&lt;jats:p&gt;Autism spectrum disorder (ASD) is a neurological illness that manifests itself through restricted and repeated activity patterns, frivolous or recidivist interests or hobbies and consistent handicaps to social interactions and exchanges. Better results and early intervention are dependent upon the early identification of people with ASD. Doctors employ a variety of techniques to anticipate autism, including genetic testing, neuropsychological testing, hearing and vision screenings, and diagnostic interviews. In addition to requiring more time and money, the traditional diagnosis approach makes the parents of children with extensive developmental abnormalities feel too inadequate to disclose their condition. So, we need a tool that can detect autism early in less time and money. Machine learning methods can be used to fulfill this criterion. In this study, deep learning with transfer learning (VGG-16) is used to detect autism through facial images of children and achieved almost 97% accuracy. The suggested model significantly improves accuracy and saves time and money by using face features in photos of children to identify early autism tendencies in children.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2025-10-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v15i5.pp4856-4864</dc:identifier><dc:identifier>10.11591/ijece.v15i5.pp4856-4864</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 15 No 5 (2025); 4856</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>https://ijece.iaescore.com/index.php/IJECE/article/viewFile/39020/18474</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>