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SS-ANFIS: a semi-supervised neuro-fuzzy model for offline signature verification

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 16 No. 4 (2026)

DOI
10.11591/ijece.v16i4.pp1985-1997
ISSN
2722-2578, 2088-8708
Published
2026-08-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Signature verification remains a critical authentication mechanism in academic and administrative environments, yet manual verification is vulnerable to forgery and subjective judgment. This study proposes SS- ANFIS, a semi-supervised neuro-fuzzy model for offline signature verification under limited labeled data conditions. The proposed model integrates pseudo-label-based self-training into a Takagi-Sugeno-Kang adaptive neuro-fuzzy inference system (ANFIS). Static image-based features were extracted from offline signature images and transformed using principal component analysis (PCA) before classification. Experiments were conducted on 800 offline signature samples collected from Dipa University Makassar, consisting of 400 genuine and 400 forged signatures. The proposed model achieved an accuracy of 90.5%, precision of 98.8%, recall of 82.0%, and F1-score of 90.0%. The high precision indicates that SS- ANFIS is effective in minimizing false positive predictions, which is important for academic document verification. The results show that the proposed model provides a practical, interpretable, and computationally efficient approach for offline signature verification, particularly in institutional settings with limited labeled data.

Collaboration network of the authors

7 authors · 21 co-authorship links

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  • Universitas DIPA Makassar
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
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Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>SS-ANFIS: a semi-supervised neuro-fuzzy model for offline signature verification</dc:title><dc:creator>Syamsuddin, Sadly</dc:creator><dc:creator>Jufri, Jufri</dc:creator><dc:creator>Rachman, Suci Rahma Dani</dc:creator><dc:creator>Suryani, Suryani</dc:creator><dc:creator>Musu, Wilem</dc:creator><dc:creator>Salmiati, Salmiati</dc:creator><dc:creator>Mangopo, Yesycha Arun</dc:creator><dc:description>&lt;jats:p&gt;Signature verification remains a critical authentication mechanism in academic and administrative environments, yet manual verification is vulnerable to forgery and subjective judgment. This study proposes SS- ANFIS, a semi-supervised neuro-fuzzy model for offline signature verification under limited labeled data conditions. The proposed model integrates pseudo-label-based self-training into a Takagi-Sugeno-Kang adaptive neuro-fuzzy inference system (ANFIS). Static image-based features were extracted from offline signature images and transformed using principal component analysis (PCA) before classification. Experiments were conducted on 800 offline signature samples collected from Dipa University Makassar, consisting of 400 genuine and 400 forged signatures. The proposed model achieved an accuracy of 90.5%, precision of 98.8%, recall of 82.0%, and F1-score of 90.0%. The high precision indicates that SS- ANFIS is effective in minimizing false positive predictions, which is important for academic document verification. The results show that the proposed model provides a practical, interpretable, and computationally efficient approach for offline signature verification, particularly in institutional settings with limited labeled data.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2026-08-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v16i4.pp1985-1997</dc:identifier><dc:identifier>10.11591/ijece.v16i4.pp1985-1997</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 16 No 4 (2026); 1985</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>https://ijece.iaescore.com/index.php/IJECE/article/viewFile/41312/18828</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>