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Scenario-driven fault injection for realistic bugs in web application testing

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 16 No. 4 (2026)

DOI
10.11591/ijece.v16i4.pp2014-2030
ISSN
2722-2578, 2088-8708
Published
2026-08-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Conventional mutation-based fault injection techniques generally produce single-line syntactic faults, which often fail to represent realistic errors at the functional requirement level because requirement context, execution paths, and functional dependencies are not considered. To address this limitation, this study proposes scenario-driven fault injection (SDFI), a scenario-based fault insertion approach that derives faults from functional requirements and test cases. SDFI integrates operational fault localization, web fault taxonomy, fault injection patterns, and functional scenario mapping to produce targeted fault injections at relevant code locations, resulting in a realistic bug dataset with multi-line faults. An experimental evaluation on a real web application produced 29 mutants, achieving a fault detection rate of 89.29% based on the RIP model. Further analysis shows that the generated mutants replicate common real-world bug characteristics, including logic errors, validation anomalies, inter-function data propagation, and multi-line faults affecting client–server application behavior. These results demonstrate that SDFI is effective in producing realistic bug datasets for evaluating software testing quality, improving test case effectiveness, and supporting further research on requirement-based fault realism.

Collaboration network of the authors

3 authors · 3 co-authorship links

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  • Politeknik Negeri Bandung
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  • Same organisation
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Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Scenario-driven fault injection for realistic bugs in web application testing</dc:title><dc:creator>Maspupah, Asri</dc:creator><dc:creator>Min, Joe Lian</dc:creator><dc:creator>Aditya, Yadhi</dc:creator><dc:description>&lt;jats:p&gt;Conventional mutation-based fault injection techniques generally produce single-line syntactic faults, which often fail to represent realistic errors at the functional requirement level because requirement context, execution paths, and functional dependencies are not considered. To address this limitation, this study proposes scenario-driven fault injection (SDFI), a scenario-based fault insertion approach that derives faults from functional requirements and test cases. SDFI integrates operational fault localization, web fault taxonomy, fault injection patterns, and functional scenario mapping to produce targeted fault injections at relevant code locations, resulting in a realistic bug dataset with multi-line faults. An experimental evaluation on a real web application produced 29 mutants, achieving a fault detection rate of 89.29% based on the RIP model. Further analysis shows that the generated mutants replicate common real-world bug characteristics, including logic errors, validation anomalies, inter-function data propagation, and multi-line faults affecting client–server application behavior. These results demonstrate that SDFI is effective in producing realistic bug datasets for evaluating software testing quality, improving test case effectiveness, and supporting further research on requirement-based fault realism.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2026-08-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v16i4.pp2014-2030</dc:identifier><dc:identifier>10.11591/ijece.v16i4.pp2014-2030</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 16 No 4 (2026); 2014</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>https://ijece.iaescore.com/index.php/IJECE/article/viewFile/41589/18830</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>