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A survey of detecting leaf diseases using machine learning and deep learning in various crops

IAES International Journal of Artificial Intelligence · Vol. 13 No. 3 (2024) · hlm. 2498–2505

DOI
10.11591/ijai.v13.i3.pp2498-2505
ISSN
2252-8938, 2089-4872
Terbit
2024-09-01
Penerbit
Institute of Advanced Engineering and Science
Bahasa
eng
Lisensi
creativecommons.org/licenses/by-sa/4.0

Abstrak

For agricultural productivity and food security to be guaranteed, early detection and treatment of illnesses are crucial. Machine learning (ML) and deep learning (DL) approaches can be used to precisely and successfully identify plant leaf diseases. A heterogeneous dataset comprising photos of both healthy and diseased leaves such as bacterial blights, fungal infections, and viral manifestations provides the foundation for the model building and training. Accuracy, precision, recall, and F1-score are the measures used to assess the model's performance. ML techniques are helpful in the identification and extraction of pertinent information from plant leaf pictures, whereas DL techniques in general, and convolutional neural networks (CNN), in particular, are remarkable at learning complex hierarchical representations. Therefore, DL architectures like CNN are utilized in conjunction with ML approaches like support vector machines (SVM), decision trees, and random forests to extract complicated patterns and attributes from leaf pictures. This research provides an extensive analysis of the performance and application of DL and ML approaches recently applied to the early identification of leaf diseases in different crops.

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23 penulis · 55 tautan kepenulisan bersama · 14 lintas organisasi

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  • Jain University
  • Visvesvaraya Technological University
  • Shri Madhwa Vadiraja Institute of Technology and Management
  • Sahyadri College of Engineering & Management
  • Nitte University
  • KLS Gogte Institute of Technology
  • AISSMS Institute of Information Technology
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Tampilkan sebagai tabel
Rekan penulisOrganisasiArtikel bersama
Ezhilarasan GanesanJain University2
V P BasheerVisvesvaraya Technological University1
Ganesh AithalShri Madhwa Vadiraja Institute of Technology and Management1
Melwin D SouzaSahyadri College of Engineering & Management1
Ananth Prabhu GurpurAfiliasi tidak diketahui1
Ranjith BhatJain University1
Rajashree NambiarNitte University1
Akshatha NaikAfiliasi tidak diketahui1
Ashwini AshwiniAfiliasi tidak diketahui1
Navilgone Krishna VaishnaviAfiliasi tidak diketahui1
Ruchitha Kamath SubhashchandraAfiliasi tidak diketahui1
Trapthi TrapthiAfiliasi tidak diketahui1
Altaf Osman MulaniAISSMS Institute of Information Technology1
Swapna SiddamsettiKLS Gogte Institute of Technology1
Melwin D SouzaAfiliasi tidak diketahui1
S SubbaiahSRM Institute of Science and Technology1
S. RamyaM. Kumarasamy College of Engineering1

Afiliasi berasal dari OpenAlex; metadata OAI-PMH jurnal tidak memuatnya. Penulis tanpa ID OpenAlex dicocokkan berdasarkan nama, sehingga dua orang bisa tergabung atau satu orang bisa terpisah.

Sumber metadata: OAI-PMH (metadata jurnal) http://ijai.iaescore.com/index.php/IJAI/oai, pertama di-harvest 8 Nov 2026, terakhir terlihat 8 Nov 2026.
Metadata asli (oai_dc)
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	<dc:title xml:lang="en-US">A survey of detecting leaf diseases using machine learning and deep learning in various crops</dc:title>
	<dc:creator>Thangamuthu, Thilagraj</dc:creator>
	<dc:creator>Kareem, Abdul</dc:creator>
	<dc:creator>Kumara, Varuna</dc:creator>
	<dc:creator>Udesh Naik, Utkrishna</dc:creator>
	<dc:creator>Poojary, Sanjana</dc:creator>
	<dc:creator>R, Bharath</dc:creator>
	<dc:subject xml:lang="en-US">machine learning, deep learning</dc:subject>
	<dc:subject xml:lang="en-US">Agricultural productivity; Convolutional neural networks; Deep learning; Machine learning; Plant leaf disease</dc:subject>
	<dc:description xml:lang="en-US">For agricultural productivity and food security to be guaranteed, early detection and treatment of illnesses are crucial. Machine learning (ML) and deep learning (DL) approaches can be used to precisely and successfully identify plant leaf diseases. A heterogeneous dataset comprising photos of both healthy and diseased leaves such as bacterial blights, fungal infections, and viral manifestations provides the foundation for the model building and training. Accuracy, precision, recall, and F1-score are the measures used to assess the model's performance. ML techniques are helpful in the identification and extraction of pertinent information from plant leaf pictures, whereas DL techniques in general, and convolutional neural networks (CNN), in particular, are remarkable at learning complex hierarchical representations. Therefore, DL architectures like CNN are utilized in conjunction with ML approaches like support vector machines (SVM), decision trees, and random forests to extract complicated patterns and attributes from leaf pictures. This research provides an extensive analysis of the performance and application of DL and ML approaches recently applied to the early identification of leaf diseases in different crops.</dc:description>
	<dc:publisher xml:lang="en-US">Institute of Advanced Engineering and Science</dc:publisher>
	<dc:contributor xml:lang="en-US"></dc:contributor>
	<dc:date>2024-09-01</dc:date>
	<dc:type>info:eu-repo/semantics/article</dc:type>
	<dc:type>info:eu-repo/semantics/publishedVersion</dc:type>
	<dc:type xml:lang="en-US"></dc:type>
	<dc:format>application/pdf</dc:format>
	<dc:identifier>https://ijai.iaescore.com/index.php/IJAI/article/view/24961</dc:identifier>
	<dc:identifier>10.11591/ijai.v13.i3.pp2498-2505</dc:identifier>
	<dc:source xml:lang="en-US">IAES International Journal of Artificial Intelligence (IJ-AI); Vol 13, No 3: September 2024; 2498-2505</dc:source>
	<dc:source>2252-8938</dc:source>
	<dc:source>2089-4872</dc:source>
	<dc:source>10.11591/ijai.v13.i3</dc:source>
	<dc:language>eng</dc:language>
	<dc:relation>https://ijai.iaescore.com/index.php/IJAI/article/view/24961/14054</dc:relation>
	<dc:rights xml:lang="en-US">Copyright (c) 2024 Institute of Advanced Engineering and Science</dc:rights>
	<dc:rights xml:lang="en-US">http://creativecommons.org/licenses/by-sa/4.0</dc:rights>
</oai_dc:dc>