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Reduction of transients in switches using embedded machine learning

International Journal of Power Electronics and Drive Systems · Vol. 11 No. 1 (2020) · hlm. 235–241

DOI
10.11591/ijpeds.v11.i1.pp235-241
ISSN
2722-256X, 2088-8694
Terbit
2020-03-01
Penerbit
Institute of Advanced Engineering and Science
Bahasa
eng
Lisensi
creativecommons.org/licenses/by-sa/4.0

Abstrak

Non-linear loads can cause transients in electronic switches. They also result in a fluctuating output when the device is switched ON or OFF. These transients can harm not only the switches but also the devices that they are connected to, by passing excess currents or voltages to the devices. By applying machine learning, we can improve the gate drive voltages of the switches and thereby reduce switch transients. A feedback system is built that measures the output transients and then feeds it to a neural network algorithm that then gives a proper gate drive to the device. This will reduce transients and also improve performances of switch based devices like inverters and converters.

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  • SRM Institute of Science and Technology
  • SRM University
  • National University of Singapore
  • Nanyang Technological University
  • Bayero University Kano
  • St. Joseph's Institute of Technology
  • Sona College of Technology
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Tampilkan sebagai tabel
Rekan penulisOrganisasiArtikel bersama
R. PalanisamySRM Institute of Science and Technology22
K. SelvakumarSRM Institute of Science and Technology13
D. KarthikeyanSRM Institute of Science and Technology13
D. SelvabharathiSRM Institute of Science and Technology9
D. SattianadanSRM Institute of Science and Technology4
V. KalyanasundhramSRM Institute of Science and Technology3
Ramiah JegatheesanSRM Institute of Science and Technology2
G. R. Prudhvi KumarSRM Institute of Science and Technology2
R. SridharSRM Institute of Science and Technology2
A. VeluAfiliasi tidak diketahui1
V. VenkatachalamSRM Institute of Science and Technology1
R. Mano NarayananSRM Institute of Science and Technology1
D. SaravanakumarSRM Institute of Science and Technology1
K. SaravananSRM Institute of Science and Technology1
C. S. BoopathiSRM Institute of Science and Technology1
T. M. Thamizh ThentralSRM Institute of Science and Technology1
Ganesan RanipriyaSRM Institute of Science and Technology1
Abdulhamid Usman MutawakkilBayero University Kano1
D. KirubakaranSt. Joseph's Institute of Technology1
V. P. ArumbuSRM Institute of Science and Technology1
P. DivyaSRM Institute of Science and Technology1
K. Mani RahulanSRM Institute of Science and Technology1
V. SinmayeeSRM Institute of Science and Technology1
K. KarthikSRM University1
Mohan Arun Noyal DossSRM University1
K. MohanrajSRM University1
Mayukh BagchiSRM Institute of Science and Technology1
Avijit BhattacharyaSRM Institute of Science and Technology1
Sayon KoleySRM Institute of Science and Technology1
Soumen GoraiSona College of Technology1
V. ShanmugasundaramSRM Institute of Science and Technology1
V. KubendranSRM Institute of Science and Technology1
Aishwarya BagchiAfiliasi tidak diketahui1

Afiliasi berasal dari OpenAlex; metadata OAI-PMH jurnal tidak memuatnya. Penulis tanpa ID OpenAlex dicocokkan berdasarkan nama, sehingga dua orang bisa tergabung atau satu orang bisa terpisah.

Sumber metadata: OAI-PMH (metadata jurnal) http://ijpeds.iaescore.com/index.php/IJPEDS/oai, pertama di-harvest 8 Nov 2026, terakhir terlihat 8 Nov 2026.
Metadata asli (oai_dc)
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	<dc:title xml:lang="en-US">Reduction of transients in switches using embedded machine learning</dc:title>
	<dc:creator>Suresh, P.</dc:creator>
	<dc:creator>Fernandez, S. George</dc:creator>
	<dc:creator>Vidyasagar, S.</dc:creator>
	<dc:creator>Kalyanasundaram, V.</dc:creator>
	<dc:creator>Vijayakumar, K.</dc:creator>
	<dc:creator>Archana, Vaidheeswaran</dc:creator>
	<dc:creator>Chatterjee, Soham</dc:creator>
	<dc:description xml:lang="en-US">Non-linear loads can cause transients in electronic switches. They also result in a fluctuating output when the device is switched ON or OFF. These transients can harm not only the switches but also the devices that they are connected to, by passing excess currents or voltages to the devices. By applying machine learning, we can improve the gate drive voltages of the switches and thereby reduce switch transients. A feedback system is built that measures the output transients and then feeds it to a neural network algorithm that then gives a proper gate drive to the device. This will reduce transients and also improve performances of switch based devices like inverters and converters.</dc:description>
	<dc:publisher xml:lang="en-US">Institute of Advanced Engineering and Science</dc:publisher>
	<dc:contributor xml:lang="en-US"></dc:contributor>
	<dc:date>2020-03-01</dc:date>
	<dc:type>info:eu-repo/semantics/article</dc:type>
	<dc:type>info:eu-repo/semantics/publishedVersion</dc:type>
	<dc:type xml:lang="en-US"></dc:type>
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	<dc:identifier>https://ijpeds.iaescore.com/index.php/IJPEDS/article/view/13050</dc:identifier>
	<dc:identifier>10.11591/ijpeds.v11.i1.pp235-241</dc:identifier>
	<dc:source xml:lang="en-US">International Journal of Power Electronics and Drive Systems (IJPEDS); Vol 11, No 1: March 2020; 235-241</dc:source>
	<dc:source>2722-256X</dc:source>
	<dc:source>2088-8694</dc:source>
	<dc:source>10.11591/ijpeds.v11.i1</dc:source>
	<dc:language>eng</dc:language>
	<dc:relation>https://ijpeds.iaescore.com/index.php/IJPEDS/article/view/13050/12993</dc:relation>
	<dc:rights xml:lang="en-US">Copyright (c) 2020 P. Suresh, S. George Fernandez, S. Vidyasagar, V. Kalyanasundaram, K. Vijayakumar, Vaidheeswaran Archana, Soham Chatterjee</dc:rights>
	<dc:rights xml:lang="en-US">http://creativecommons.org/licenses/by-sa/4.0</dc:rights>
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