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Impact of grading capacitor on transient recovery voltage due to shunt reactor de-energization for different values of current chopping

International Journal of Power Electronics and Drive Systems · Vol. 15 No. 2 (2024) · hlm. 1300–1307

DOI
10.11591/ijpeds.v15.i2.pp1300-1307
ISSN
2722-256X, 2088-8694
Terbit
2024-06-01
Penerbit
Institute of Advanced Engineering and Science
Bahasa
eng
Lisensi
creativecommons.org/licenses/by-sa/4.0

Abstrak

This paper investigates the impact of grading capacitors on transient recovery voltage (TRV) during shunt reactor switching in high voltage systems, considering different levels of current chopping. Shunt reactor de-energization can result in voltage surges and instability due to current chopping effects. The study utilizes simulation models using ATP-Draw software to assess the effectiveness of grading capacitors in mitigating TRV under various operating conditions as well as of using a proposed method to mitigate the excessive TRV across the circuit breaker. The findings provide valuable insights into managing TRV during shunt reactor switching, enhancing power system stability and reliability. The results obtained showed that the TRV across the circuit breaker decreased by 61.5% by using circuit modification as well as adding a grading capacitor.

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  • Universiti Sains Malaysia
  • Universiti Putra Malaysia
  • Al Ain University
  • Université du Québec
  • Bandung Institute of Technology
  • Universiti Malaysia Pahang Al-Sultan Abdullah
  • Kyushu Institute of Technology
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Rekan penulisOrganisasiArtikel bersama
Ubaid UllahAl Ain University1
Ismail Ben MabroukAl Ain University1
Muath Al‐HasanAl Ain University1
Mourad NedilUniversité du Québec1
Umar KhayamBandung Institute of Technology1
Nor Asiah MuhamadUniversiti Sains Malaysia1
Nazatul Shiema Moh NazarUniversiti Sains Malaysia1
Noor Syazwani MansorUniversiti Sains Malaysia1
Mariatti Jaafar MustaphaUniversiti Sains Malaysia1
Amir Izzani MohamedUniversiti Malaysia Pahang Al-Sultan Abdullah1
Norhafiz B. AzisUniversiti Putra Malaysia1
Mohd Amran Mohd RadziUniversiti Putra Malaysia1
Ahmad Hafiz Mohd HashimUniversiti Putra Malaysia1
Jasronita JasniUniversiti Putra Malaysia1
Masahiro KozakoKyushu Institute of Technology1
Zaini YaakubAfiliasi tidak diketahui1
Raghad Adeeb OthmanUniversity of Mosul1

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Sumber metadata: OAI-PMH (metadata jurnal) http://ijpeds.iaescore.com/index.php/IJPEDS/oai, pertama di-harvest 8 Nov 2026, terakhir terlihat 8 Nov 2026.
Metadata asli (oai_dc) 
<oai_dc:dc xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/  http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
	<dc:title xml:lang="en-US">Impact of grading capacitor on transient recovery voltage due to shunt reactor de-energization for different values of  current chopping</dc:title>
	<dc:creator>Al-Tak, Mazyed A.</dc:creator>
	<dc:creator>Ain, Mohd Fadzil</dc:creator>
	<dc:creator>Al-Yozbaky, Omar Sh.</dc:creator>
	<dc:creator>Jamil, Mohamad Kamarol Mohd</dc:creator>
	<dc:subject xml:lang="en-US">ATP-Draw; controlled switching; current chopping; grading capacitor; shunt reactor; voltage re-ignition</dc:subject>
	<dc:description xml:lang="en-US">This paper investigates the impact of grading capacitors on transient recovery voltage (TRV) during shunt reactor switching in high voltage systems, considering different levels of current chopping. Shunt reactor de-energization can result in voltage surges and instability due to current chopping effects. The study utilizes simulation models using ATP-Draw software to assess the effectiveness of grading capacitors in mitigating TRV under various operating conditions as well as of using a proposed method to mitigate the excessive TRV across the circuit breaker. The findings provide valuable insights into managing TRV during shunt reactor switching, enhancing power system stability and reliability. The results obtained showed that the TRV across the circuit breaker decreased by 61.5% by using circuit modification as well as adding a grading capacitor.</dc:description>
	<dc:publisher xml:lang="en-US">Institute of Advanced Engineering and Science</dc:publisher>
	<dc:contributor xml:lang="en-US"></dc:contributor>
	<dc:date>2024-06-01</dc:date>
	<dc:type>info:eu-repo/semantics/article</dc:type>
	<dc:type>info:eu-repo/semantics/publishedVersion</dc:type>
	<dc:type xml:lang="en-US"></dc:type>
	<dc:format>application/pdf</dc:format>
	<dc:identifier>https://ijpeds.iaescore.com/index.php/IJPEDS/article/view/23033</dc:identifier>
	<dc:identifier>10.11591/ijpeds.v15.i2.pp1300-1307</dc:identifier>
	<dc:source xml:lang="en-US">International Journal of Power Electronics and Drive Systems (IJPEDS); Vol 15, No 2: June 2024; 1300-1307</dc:source>
	<dc:source>2722-256X</dc:source>
	<dc:source>2088-8694</dc:source>
	<dc:source>10.11591/ijpeds.v15.i2</dc:source>
	<dc:language>eng</dc:language>
	<dc:relation>https://ijpeds.iaescore.com/index.php/IJPEDS/article/view/23033/14585</dc:relation>
	<dc:rights xml:lang="en-US">Copyright (c) 2024 Mazyed Awan Al-Tak, Mohd Fadzil Bin Ain, Omar Sh. Al-Yozbaky, Mohamad Kamarol Mohd Jamil</dc:rights>
	<dc:rights xml:lang="en-US">http://creativecommons.org/licenses/by-sa/4.0</dc:rights>
</oai_dc:dc>