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Penentuan Peak Kilovoltage (kVp) Pesawat Sinar-X Dengan Pemanfaatan Imaging Plate (IP) Di RSUD Dr. Moewardi

INDONESIAN JOURNAL OF APPLIED PHYSICS · Vol. 11 No. 2 (2021) · hlm. 126–133

DOI
10.13057/ijap.v11i2.45431
ISSN
2477-6416, 2089-0133
Terbit
2021-10-17
Penerbit
Department of Physics, Sebelas Maret University
Bahasa
eng

Abstrak

Research has been carried out to determine the kVp of X-ray aircraft using an imaging plate (IP) as a measuring tool. The imaging plate functions to record images after irradiation and as a detector to capture and store X-ray energy when it penetrates an object. The purpose of this study is to use IP as a kVp measurement tool. The method used is to create a characteristic curve of the relationship between the ratio of Region of Interest (ROI) of two aluminum filters to rated voltage (kVp). From the research obtained the equation y = 2816.61 x2 – 4532.19 x + 1878.65 with R2 = 0.988. The kVp test was carried out using a fluoroscopic X-ray model SM-20HFH. The test results obtained that the measured kVp value at a voltage of 70 kV was 66.21 kV and an error value of 5.41%. While the measured kVp value at 55 kV is 58.95 kV with an error value of -7.18%. These results indicate that IP can be used to measure kVp with an error below the allowable tolerance, namely the max error ≤ of 10%.

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  • Sebelas Maret University
  • Serang Raya University
  • Universitas Raharja
  • Dili Institute of Technology
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Rekan penulisOrganisasiArtikel bersama
Budi PurnamaSebelas Maret University3
Suharno SuharnoSebelas Maret University2
Riyatun RiyatunSebelas Maret University2
Nuryani NuryaniSebelas Maret University2
Untung RahardjaUniversitas Raharja1
Hamdan HamdanSerang Raya University1
Adele ValerryAfiliasi tidak diketahui1
Nur MaliyaAfiliasi tidak diketahui1
Sudargo SudargoAfiliasi tidak diketahui1
Mohtar YuniantoSebelas Maret University1
Nanang WiyonoSebelas Maret University1
Yusuf Anggara AjiSebelas Maret University1
Dwi Teguh RaharjoSebelas Maret University1
Yeni Herlina K. DasiDili Institute of Technology1
Yofentina IrianiSebelas Maret University1
Nurdiyantoro Putra PrasetyaSebelas Maret University1
Ramadona RahmawatiSebelas Maret University1
Adiana MusadewiSebelas Maret University1
Sri BudiawantiSebelas Maret University1
Dwi Teguh RahardjoSebelas Maret University1

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Sumber metadata: OAI-PMH (metadata jurnal) https://jurnal.uns.ac.id/ijap/oai, pertama di-harvest 8 Nov 2026, terakhir terlihat 8 Nov 2026.
Metadata asli (oai_dc) 
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	<dc:title xml:lang="en-US">Penentuan Peak Kilovoltage (kVp) Pesawat Sinar-X Dengan Pemanfaatan Imaging Plate (IP) Di RSUD Dr. Moewardi</dc:title>
	<dc:creator>Cahyani, Bibit</dc:creator>
	<dc:creator>Utari, Utari</dc:creator>
	<dc:creator>Muhtarom, Muhtarom</dc:creator>
	<dc:subject xml:lang="en-US">Imaging plate; image; ROI; X-rays; kVp</dc:subject>
	<dc:description xml:lang="en-US">Research has been carried out to determine the kVp of X-ray aircraft using an imaging plate (IP) as a measuring tool. The imaging plate functions to record images after irradiation and as a detector to capture and store X-ray energy when it penetrates an object. The purpose of this study is to use IP as a kVp measurement tool. The method used is to create a characteristic curve of the relationship between the ratio of Region of Interest (ROI) of two aluminum filters to rated voltage (kVp). From the research obtained the equation y = 2816.61 x2 – 4532.19 x + 1878.65 with R2 = 0.988. The kVp test was carried out using a fluoroscopic X-ray model SM-20HFH. The test results obtained that the measured kVp value at a voltage of 70 kV was 66.21 kV and an error value of 5.41%. While the measured kVp value at 55 kV is 58.95 kV with an error value of -7.18%. These results indicate that IP can be used to measure kVp with an error below the allowable tolerance, namely the max error ≤ of 10%.</dc:description>
	<dc:publisher xml:lang="en-US">Department of Physics, Sebelas Maret University</dc:publisher>
	<dc:contributor xml:lang="en-US">Fakultas Matematika dan Ilmu Pengetahuan Alam, Universitas Sebelas Maret Surakarta</dc:contributor>
	<dc:date>2021-10-17</dc:date>
	<dc:type>info:eu-repo/semantics/article</dc:type>
	<dc:type>info:eu-repo/semantics/publishedVersion</dc:type>
	<dc:type xml:lang="en-US">Peer-reviewed Article</dc:type>
	<dc:format>application/pdf</dc:format>
	<dc:identifier>https://jurnal.uns.ac.id/ijap/article/view/45431</dc:identifier>
	<dc:identifier>10.13057/ijap.v11i2.45431</dc:identifier>
	<dc:source xml:lang="en-US">INDONESIAN JOURNAL OF APPLIED PHYSICS; Vol 11, No 2 (2021): October; 126-133</dc:source>
	<dc:source>2477-6416</dc:source>
	<dc:source>2089-0133</dc:source>
	<dc:language>eng</dc:language>
	<dc:relation>https://jurnal.uns.ac.id/ijap/article/view/45431/33178</dc:relation>
	<dc:relation>https://jurnal.uns.ac.id/ijap/article/downloadSuppFile/45431/5660</dc:relation>
	<dc:rights xml:lang="en-US">Copyright (c) 2021 INDONESIAN JOURNAL OF APPLIED PHYSICS</dc:rights>
</oai_dc:dc>