Melola Discovery

← Melola Discovery

Jurnal SINTA 1

An Efficient Approach To Voltage Stability Evaluation Using Tellegen’s Equations

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 3 No. 2 (2013)

DOI
10.11591/ijece.v3i2.1964
ISSN
2088-8708
Published
2013-04-02
Publisher
Institute of Advanced Engineering and Science

Collaboration network of the authors

4 authors · 4 co-authorship links · 3 across different organisations

Hover or tap a name to highlight its co-authors. Double-click to open the author's page.

  • University of Tehran
  • Islamic Azad University Sari Branch
  • Sharif University of Technology
  • Affiliation unknown
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
Show as table
Co-authorOrganisationJoint articles
Ali HajiloazarIslamic Azad University Sari Branch1
Mahmood FotuhiSharif University of Technology1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>An Efficient Approach To Voltage Stability Evaluation Using Tellegen’s Equations</dc:title><dc:creator>Mohammadi, Payman</dc:creator><dc:creator>Lesani, Hamid</dc:creator><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2013-04-02</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:identifier>https://doi.org/10.11591/ijece.v3i2.1964</dc:identifier><dc:identifier>10.11591/ijece.v3i2.1964</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 3 No 2 (2013)</dc:source><dc:source>2088-8708</dc:source></oai_dc:dc>