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EEG Based Eye State Classification using Deep Belief Network and Stacked AutoEncoder

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 6 No. 6 (2016)

DOI
10.11591/ijece.v6i6.12967
ISSN
2088-8708, 2088-8708
Published
2016-12-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-nc-nd/4.0

Abstract

A Brain-Computer Interface (BCI) provides an alternative communication interface between the human brain and a computer. The Electroencephalogram (EEG) signals are acquired, processed and machine learning algorithms are further applied to extract useful information. During EEG acquisition, artifacts are induced due to involuntary eye movements or eye blink, casting adverse effects on system performance. The aim of this research is to predict eye states from EEG signals using Deep learning architectures and present improved classifier models. Recent studies reflect that Deep Neural Networks are trending state of the art Machine learning approaches. Therefore, the current work presents the implementation of Deep Belief Network (DBN) and Stacked AutoEncoders (SAE) as Classifiers with encouraging performance accuracy. One of the designed SAE models outperforms the performance of DBN and the models presented in existing research by an impressive error rate of 1.1% on the test set bearing accuracy of 98.9%. The findings in this study, may provide a contribution towards the state of the art performance on the problem of EEG based eye state classification.

Collaboration network of the authors

4 authors · 5 co-authorship links · 3 across different organisations

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  • Politecnico di Torino
  • University of Pavia
  • City, University of London
  • Affiliation unknown
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
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Co-authorOrganisationJoint articles
Muhammad Moazzam JawaidCity, University of London2

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 1 Nov 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>EEG Based Eye State Classification using Deep Belief Network and Stacked AutoEncoder</dc:title><dc:creator>Narejo, Sanam</dc:creator><dc:creator>Pasero, Eros</dc:creator><dc:creator>Kulsoom, Farzana</dc:creator><dc:description>&lt;jats:p&gt;&amp;lt;p&amp;gt;A Brain-Computer Interface (BCI) provides an alternative communication interface between the human brain and a computer. The Electroencephalogram (EEG) signals are acquired, processed and machine learning algorithms are further applied to extract useful information.  During  EEG acquisition,   artifacts  are induced due to involuntary eye movements or eye blink, casting adverse effects  on system performance. The aim of this research is to predict eye states from EEG signals using Deep learning architectures and present improved classifier models. Recent studies reflect that Deep Neural Networks are trending state of the art Machine learning approaches. Therefore, the current work presents the implementation of  Deep Belief Network (DBN) and Stacked AutoEncoders (SAE) as Classifiers with encouraging performance accuracy.  One of the designed  SAE models outperforms the  performance of DBN and the models presented in existing research by an impressive error rate of 1.1% on the test set bearing accuracy of 98.9%. The findings in this study,  may provide a contribution towards the state of  the  art performance on the problem of  EEG based eye state classification.&amp;lt;/p&amp;gt;&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2016-12-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v6i6.12967</dc:identifier><dc:identifier>10.11591/ijece.v6i6.12967</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 6 No 6 (2016); 3131</dc:source><dc:source>2088-8708</dc:source><dc:source>2088-8708</dc:source><dc:relation>http://www.iaescore.com/journals/index.php/IJECE/article/viewFile/5933/5619</dc:relation><dc:rights>http://creativecommons.org/licenses/by-nc-nd/4.0</dc:rights></oai_dc:dc>