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Using Attribute Oriented Induction High Level Emerging Pattern (AOI-HEP) to Mine Frequent Patterns

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 6 No. 6 (2016)

DOI
10.11591/ijece.v6i6.10579
ISSN
2088-8708, 2088-8708
Published
2016-12-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-nc-nd/4.0

Abstract

Frequent patterns in Attribute Oriented Induction High level Emerging Pattern (AOI-HEP), are recognized when have maximum subsumption target (superset) into contrasting (subset) datasets (contrasting ⊂ target) and having large High Emerging Pattern (HEP) growth rate and support in target dataset. HEP Frequent patterns had been successful mined with AOI-HEP upon 4 UCI machine learning datasets such as adult, breast cancer, census and IPUMS with the number of instances of 48842, 569, 2458285 and 256932 respectively and each dataset has concept hierarchies built from its five chosen attributes. There are 2 and 1 finding frequent patterns from adult and breast cancer datasets, while there is no frequent pattern from census and IPUMS datasets. The finding HEP frequent patterns from adult dataset are adult which have government workclass with an intermediate education (80.53%) and America as native country(33%). Meanwhile, the only 1 HEP frequent pattern from breast cancer dataset is breast cancer which have clump thickness type of AboutAverClump with cell size of VeryLargeSize(3.56%). Finding HEP frequent patterns with AOI-HEP are influenced by learning on high level concept in one of chosen attribute and extended experiment upon adult dataset where learn on marital-status attribute showed that there is no finding frequent pattern.

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Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Using Attribute Oriented Induction High Level Emerging Pattern (AOI-HEP) to Mine Frequent Patterns</dc:title><dc:creator>Spits Warnars, Harco Leslie Hendric</dc:creator><dc:description>&lt;jats:p&gt;&amp;lt;p&amp;gt;&amp;lt;span lang="EN-US"&amp;gt;Frequent patterns in Attribute Oriented Induction High level Emerging Pattern (AOI-HEP), are recognized when have maximum subsumption target (superset) into contrasting (subset) datasets (contrasting &amp;lt;/span&amp;gt;&amp;lt;span lang="EN-US"&amp;gt;⊂&amp;lt;/span&amp;gt;&amp;lt;span lang="EN-US"&amp;gt; target) and having large High Emerging Pattern (HEP) growth rate and support in target dataset. HEP Frequent patterns had been successful mined with AOI-HEP upon 4 UCI machine learning datasets such as adult, breast cancer, census and IPUMS with the number of instances of 48842, 569, 2458285 and 256932 respectively and each dataset has concept hierarchies built from its five chosen attributes. There are 2 and 1 finding frequent patterns from adult and breast cancer datasets, while there is no frequent pattern from census and IPUMS datasets. The finding HEP frequent patterns from adult dataset are adult which have government workclass with an intermediate education (80.53%) and America as native country(33%). Meanwhile, the only 1 HEP frequent pattern from breast cancer dataset is breast cancer which have clump thickness type of AboutAverClump with cell size of VeryLargeSize(3.56%). Finding HEP frequent patterns with AOI-HEP are influenced by learning on high level concept in one of chosen attribute and extended experiment upon adult dataset where learn on marital-status attribute showed that there is no finding frequent pattern.&amp;lt;/span&amp;gt;&amp;lt;/p&amp;gt;&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2016-12-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v6i6.10579</dc:identifier><dc:identifier>10.11591/ijece.v6i6.10579</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 6 No 6 (2016); 3037</dc:source><dc:source>2088-8708</dc:source><dc:source>2088-8708</dc:source><dc:relation>http://www.iaescore.com/journals/index.php/IJECE/article/viewFile/5921/5583</dc:relation><dc:rights>http://creativecommons.org/licenses/by-nc-nd/4.0</dc:rights></oai_dc:dc>