This paper presents a technique to determine the Dielectric constant and dielectric loss of the building dielectric materials using propagation constant measurements. The material sample is loaded in an X-band (8.5GHz-12.5GHz) rectangular waveguide and its two port S-parameters are measured as a function of frequency using a Vector Network Analyzer without TRL Calibration. The results obtained from samples of dielectric materials (Air, Cellular concrete and Wood) on the X-band frequencies show the validity of the proposed technique to determine the complex permittivity of the building dielectric materials on the X-band frequencies.
Collaboration network of the authors
10 authors ·
28 co-authorship links
· 14 across different organisations
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Université Hassan 1er
Centre Régional des Métiers de l'Éducation et de la Formation Casablanca-Settat
École Supérieure d'Électronique de l'Ouest
Université du Québec
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