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Effect of Chirality and Oxide Thikness on the Performance of a Ballistic CNTFET

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 8 No. 6 (2018)

DOI
10.11591/ijece.v8i6.pp4941-4950
ISSN
2088-8708, 2088-8708
Published
2018-12-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-nc/4.0

Abstract

Since the discovery of 1D nano-object, they are constantly revealing significant physical properties. In this regard, carbon nanotube (CNT) is considered as a promising candidate for application in future nanoelectronics devices like carbon nanotube field effect transistor (CNTFET). In this work, the impact of chirality and gate oxide thikness on the electrical characteristics of a CNTFET are studied. The chiralities used are (5, 0), (10, 0), (19, 0), (26, 0), and the gate oxide thikness varied from 1 to 5 nm.This work is based on a numerical simulation program based on surface potential model. CNTFET Modeling is useful for semiconductor industries for nano scale devices manufacturing. From our results we have observed that the output current increases with chirality increasing.We have also highlight the importance of the gate oxide thickness on the drain current that increases when gate oxide is thin.

Collaboration network of the authors

2 authors · 1 co-authorship link

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  • University of Abou Bekr Belkaïd
  • Different organisations
  • Same organisation
  • Affiliation unknown
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This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 1 Nov 2026.
Metadata as oai_dc, converted from Crossref
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