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Comprehensive identification of sensitive and stable ISFET sensing layer high-k gate based on ISFET/electrolyte models

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 9 No. 2 (2019)

DOI
10.11591/ijece.v9i2.pp926-933
ISSN
2088-8708, 2088-8708
Published
2019-04-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-nc/4.0

Abstract

The ISFET sensing membrane is in direct contact with the electrolyte solution, determining the starting sensitivity of these devices. A SiO2 gate dielectric shows a low response sensitivity and poor stability. This paper proposes a comprehensive identification of different high-k materials which can be used for this purpose, rather than SiO2. The Gouy-Chapman and Gouy-Chapman-Stern models were combined with the Site-binding model, based on surface potential sensitivity, to achieve the work objectives. Five materials, namely Al2O3, Ta2O5, Hfo2, Zro2 and SN2O3, which are commonly considered for micro-electronic applications, were compared. This study has identified that Ta2O5 have a high surface potential response at around 59mV/pH, and also exhibits high stability in different electrolyte concentrations. The models used have been validated with real experimental data, which achieved excellent agreement. The insights gained from this study may be of assistance to determine the suitability of different materials before progressing to expensive real ISFET fabrication.

Collaboration network of the authors

11 authors · 29 co-authorship links

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  • Universiti Teknikal Malaysia Melaka
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
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Co-authorOrganisationJoint articles
Khairil Ezwan KaharudinUniversiti Teknikal Malaysia Melaka2
Ameer Farhan RoslanUniversiti Teknikal Malaysia Melaka2
Zahriladha ZakariaUniversiti Teknikal Malaysia Melaka1
Mowafak Khadom MohsenUniversiti Teknikal Malaysia Melaka1
M. S. M. IsaUniversiti Teknikal Malaysia Melaka1
Muhannad Kaml AbdulhameedUniversiti Teknikal Malaysia Melaka1
Mothana Lafta AttiahUniversiti Teknikal Malaysia Melaka1
Imran Mohd IbrahimUniversiti Teknikal Malaysia Melaka1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Comprehensive identification of sensitive and stable ISFET sensing layer high-k gate based on ISFET/electrolyte models</dc:title><dc:creator>Dinar, Ahmed M.</dc:creator><dc:creator>Zain, A. S. Mohd</dc:creator><dc:creator>Salehuddin, F.</dc:creator><dc:description>&lt;jats:p&gt;The ISFET sensing membrane is in direct contact with the electrolyte solution, determining the starting sensitivity of these devices. A SiO2 gate dielectric shows a low response sensitivity and poor stability. This paper proposes a comprehensive identification of different high-k materials which can be used for this purpose, rather than SiO2. The Gouy-Chapman and Gouy-Chapman-Stern models were combined with the Site-binding model, based on surface potential sensitivity, to achieve the work objectives. Five materials, namely Al2O3, Ta2O5, Hfo2, Zro2 and SN2O3, which are commonly considered for micro-electronic applications, were compared. This study has identified that Ta2O5 have a high surface potential response at around 59mV/pH, and also exhibits high stability in different electrolyte concentrations. The models used have been validated with real experimental data, which achieved excellent agreement. The insights gained from this study may be of assistance to determine the suitability of different materials before progressing to expensive real ISFET fabrication.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2019-04-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v9i2.pp926-933</dc:identifier><dc:identifier>10.11591/ijece.v9i2.pp926-933</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 9 No 2 (2019); 926</dc:source><dc:source>2088-8708</dc:source><dc:source>2088-8708</dc:source><dc:relation>http://ijece.iaescore.com/index.php/IJECE/article/viewFile/13835/11594</dc:relation><dc:rights>http://creativecommons.org/licenses/by-nc/4.0</dc:rights></oai_dc:dc>