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Handling Low and High Demand Mode on Safety Instrumented Function

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 5 No. 4 (2015)

DOI
10.11591/ijece.v5i4.pp742-749
ISSN
2088-8708, 2088-8708
Terbit
2015-08-01
Penerbit
Institute of Advanced Engineering and Science
Lisensi
creativecommons.org/licenses/by-nc/4.0

Abstrak

In this paper, demand rate and hazardous event frequency considerations which effect to the error on the SIL calculation will be discused. The various value of hazardous event frequency and demand rate will be evaluated in this paper. The result of this paper is when hazardous event frequency 10E-06/year and PFD’s safeguard 0.00002, with test interval 1 year, the SILs of low and high demand start showing different level at demand 5.1/year. At that point, we shouldn’t use simplified formula for low demand, because it will make different SIL with the exponential formula and simplified high demand formula. The requared SIL targets are SIL 2 and SIL 1, for exponential formula and simplified high demand formula, respectifely. Hence, it should be taken more attention and consideration for various value of hazardous event frequency with various demand rate.

Jaringan kolaborasi para penulis

19 penulis · 66 tautan kepenulisan bersama · 33 lintas organisasi

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  • Institut Teknologi Sepuluh Nopember
  • University of Palangka Raya
  • University of Pembangunan Nasional Veteran Jawa Timur
  • State University of Makassar
  • Universitas Islam Malang
  • University of Surabaya
  • Universitas Gadjah Mada
  • Afiliasi tidak diketahui
  • Organisasi berbeda
  • Organisasi sama
  • Afiliasi tidak diketahui
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Tampilkan sebagai tabel
Rekan penulisOrganisasiArtikel bersama
Hudiyo FirmantoUniversity of Surabaya2
Akhmad Faruq AlhikamiUniversitas Islam Malang2
Ridho HantoroInstitut Teknologi Sepuluh Nopember2
Gunawan NugrohoInstitut Teknologi Sepuluh Nopember2
Joko WaluyoUniversitas Gadjah Mada2
Agus Imam SonhajiAfiliasi tidak diketahui2
Angga Riska WilarsoAfiliasi tidak diketahui1
Hamzah FansuriInstitut Teknologi Sepuluh Nopember1
R. Y. Perry BurhanInstitut Teknologi Sepuluh Nopember1
Rendy Muhamad IqbalUniversity of Palangka Raya1
Warih SupriadiInstitut Teknologi Sepuluh Nopember1
Silvana Dwi NurherdianaUniversity of Pembangunan Nasional Veteran Jawa Timur1
Ririn Eva HidayatiInstitut Teknologi Sepuluh Nopember1
Subaer SubaerState University of Makassar1

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Sumber metadata: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, pertama di-harvest 27 Okt 2026, terakhir terlihat 8 Nov 2026.
Metadata sebagai oai_dc, dikonversi dari Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Handling Low and High Demand Mode on Safety Instrumented Function</dc:title><dc:creator>R. Biyanto, Totok</dc:creator><dc:creator>Kusuma, Franky</dc:creator><dc:creator>Cordova, Hendra</dc:creator><dc:creator>Sutatio, Yerry</dc:creator><dc:creator>Bayuaji, Ridho</dc:creator><dc:description>&lt;jats:p&gt;In this paper, demand rate and hazardous event frequency considerations which effect to the error on the SIL calculation will be discused. The various value of hazardous event frequency and demand rate will be evaluated in this paper. The  result of this paper is when hazardous event frequency 10E-06/year and PFD’s safeguard 0.00002, with test interval 1 year, the SILs of low and high demand start showing different level at demand 5.1/year. At that point, we shouldn’t use simplified formula for low demand, because it will make different SIL with the exponential formula and simplified high demand formula. The requared SIL targets are SIL 2 and SIL 1, for exponential formula and simplified high demand formula, respectifely. Hence, it should be taken more attention and consideration for various value of hazardous event frequency with various demand rate.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2015-08-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v5i4.pp742-749</dc:identifier><dc:identifier>10.11591/ijece.v5i4.pp742-749</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 5 No 4 (2015); 742</dc:source><dc:source>2088-8708</dc:source><dc:source>2088-8708</dc:source><dc:relation>http://ijece.iaescore.com/index.php/IJECE/article/viewFile/5668/4635</dc:relation><dc:rights>http://creativecommons.org/licenses/by-nc/4.0</dc:rights></oai_dc:dc>