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DC and RF characteristics of 20 nm gate length InAlAs/InGaAs/InP HEMTs for high frequency application

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 10 No. 2 (2020)

DOI
10.11591/ijece.v10i2.pp1248-1254
ISSN
2088-8708, 2088-8708
Published
2020-04-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-nc/4.0

Abstract

lnAlAs/lnGaAs/InP high electron mobility transistor (HEMT) offers excellent high frequency operation.In this work,the DC and RF performance of a 20 nm gate length enhancement mode InAlAs/InGaAs/InP high electron mobility transistor (HEMT) on InP substrate are presented.The SILVACO-TCAD simulations performed at room temperature using the appropriate model sshowed that the studied device exhibit excellent pinch-off characteristics, with a maximum transconductance of 1100ms/mm, a threshold voltage of 0,62V, and an Ion/Ioff ratio of 2.106. The cut-off frequency and maximum frequency of oscillation are 980 GHz and 1.3THz respectively. These promising results allow us to affirm that this device is intended to be used in high frequency applications.

Collaboration network of the authors

7 authors · 8 co-authorship links

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  • University of Abou Bekr Belkaïd
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
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Co-authorOrganisationJoint articles
M. KhaouaniUniversity of Abou Bekr Belkaïd1
Amine Mohammed TaberkitUniversity of Abou Bekr Belkaïd1
Benyounes BouazzaUniversity of Abou Bekr Belkaïd1
Faiza MeradUniversity of Abou Bekr Belkaïd1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>DC and RF characteristics of 20 nm gate length InAlAs/InGaAs/InP HEMTs for high frequency application</dc:title><dc:creator>Boursali, Amin</dc:creator><dc:creator>Guen-Bouazza, Ahlam</dc:creator><dc:creator>Sayah, Choukria</dc:creator><dc:description>&lt;jats:p&gt;lnAlAs/lnGaAs/InP high electron mobility transistor (HEMT) offers excellent high frequency operation.In this work,the DC and RF performance of a 20 nm gate length enhancement mode InAlAs/InGaAs/InP high electron mobility transistor (HEMT) on InP substrate are presented.The SILVACO-TCAD simulations performed at room temperature using the appropriate model sshowed that the studied device exhibit excellent pinch-off characteristics, with a maximum transconductance of 1100ms/mm, a threshold voltage of   0,62V, and an Ion/Ioff ratio of 2.106. The cut-off frequency and maximum frequency of oscillation are 980 GHz and 1.3THz respectively. These promising results allow us to affirm that this device is intended to be used in high frequency applications.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2020-04-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v10i2.pp1248-1254</dc:identifier><dc:identifier>10.11591/ijece.v10i2.pp1248-1254</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 10 No 2 (2020); 1248</dc:source><dc:source>2088-8708</dc:source><dc:source>2088-8708</dc:source><dc:relation>http://ijece.iaescore.com/index.php/IJECE/article/viewFile/18322/pdf</dc:relation><dc:rights>http://creativecommons.org/licenses/by-nc/4.0</dc:rights></oai_dc:dc>