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TFI-FTS: An efficient transient fault injection and fault-tolerant system for asynchronous circuits on FPGA platform

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 11 No. 3 (2021)

DOI
10.11591/ijece.v11i3.pp2704-2710
ISSN
2722-2578, 2088-8708
Published
2021-06-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Designing VLSI digital circuits is challenging tasks because of testing the circuits concerning design time. The reliability and productivity of digital integrated circuits are primarily affected by the defects in the manufacturing process or systems. If the defects are more in the systems, which leads the fault in the systems. The fault tolerant systems are necessary to overcome the faults in the VLSI digital circuits. In this research article, an asynchronous circuits based an effective transient fault injection (TFI) and fault tolerant system (FTS) are modelled. The TFI system generates the faults based on BMA based LFSR with faulty logic insertion and one hot encoded register. The BMA based LFSR reduces the hardware complexity with less power consumption on-chip than standard LFSR method. The FTS uses triple mode redundancy (TMR) based majority voter logic (MVL) to tolerant the faults for asynchronous circuits. The benchmarked 74X-series circuits are considered as an asynchronous circuit for TMR logic. The TFI-FTS module is modeled using Verilog-HDL on Xilinx-ISE and synthesized on hardware platform. The Performance parameters are tabulated for TFI-FTS based asynchronous circuits. The performance of TFI-FTS Module is analyzed with 100% fault coverage. The fault coverage is validated using functional simulation of each asynchronous circuit with fault injection in TFI-FTS Module.

Collaboration network of the authors

3 authors · 2 co-authorship links

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  • Dayananda Sagar College of Engineering
  • Different organisations
  • Same organisation
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Co-authorOrganisationJoint articles
Vivek Raj KempannaDayananda Sagar College of Engineering1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
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