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Automatic missing value imputation for cleaning phase of diabetic’s readmission prediction model

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 12 No. 2 (2022)

DOI
10.11591/ijece.v12i2.pp2001-2013
ISSN
2722-2578, 2088-8708
Published
2022-04-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Recently, the industry of healthcare started generating a large volume of datasets. If hospitals can employ the data, they could easily predict the outcomes and provide better treatments at early stages with low cost. Here, data analytics (DA) was used to make correct decisions through proper analysis and prediction. However, inappropriate data may lead to flawed analysis and thus yield unacceptable conclusions. Hence, transforming the improper data from the entire data set into useful data is essential. Machine learning (ML) technique was used to overcome the issues due to incomplete data. A new architecture, automatic missing value imputation (AMVI) was developed to predict missing values in the dataset, including data sampling and feature selection. Four prediction models (i.e., logistic regression, support vector machine (SVM), AdaBoost, and random forest algorithms) were selected from the well-known classification. The complete AMVI architecture performance was evaluated using a structured data set obtained from the UCI repository. Accuracy of around 90% was achieved. It was also confirmed from cross-validation that the trained ML model is suitable and not over-fitted. This trained model is developed based on the dataset, which is not dependent on a specific environment. It will train and obtain the outperformed model depending on the data available.

Collaboration network of the authors

33 authors · 112 co-authorship links · 49 across different organisations

Hover or tap a name to highlight its co-authors. Double-click to open the author's page.

  • Multimedia University
  • Alliance University
  • Pabna University of Science and Technology
  • Feni University
  • Charles Sturt University
  • Wayne State University
  • Dhaka International University
  • Other organisations
  • Affiliation unknown
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
Show as table
Co-authorOrganisationJoint articles
Gajula Ramana MurthyAlliance University7
Abdullah Al MamunMultimedia University6
Azlan Abd AzizMultimedia University4
Poh Ping EmMultimedia University3
Anik TahabilderWayne State University3
Md. Armanur RahmanMultimedia University3
Aziza SultanaDhaka International University3
E.M.H. ArifAffiliation unknown3
Ahmmad MushaPabna University of Science and Technology2
Chinthakunta VenkataseshaiahMultimedia University2
CK HoMultimedia University2
Tan Kim GeokMultimedia University2
Ferdous HossainMultimedia University2
Ali Afzalian MandMultimedia University2
Muhammad Amer Ridzuan Bin ZuberMultimedia University2
Nor Azlina Ab. AzizMultimedia University1
Busrat HossenFeni University1
Sima RanjbariTarbiat Modares University1
Rehnuma HasnatPabna University of Science and Technology1
Sohag Kumar SahaTennessee Technological University1
Busrat JahanFeni University1
Sumendra YogarayanMultimedia University1
Siti Fatimah Abdul RazakAffiliation unknown1
Lim Ke YinMultimedia University1
Umar Ali BukarMultimedia University1
Melanie HeierCharles Sturt University1
Penatiyana W. Chandana PrasadCharles Sturt University1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Automatic missing value imputation for cleaning phase of diabetic’s readmission prediction model</dc:title><dc:creator>Mohd Zebaral Hoque, Jesmeen</dc:creator><dc:creator>Hossen, Jakir</dc:creator><dc:creator>Sayeed, Shohel</dc:creator><dc:creator>Mohammed Tawsif K., Chy.</dc:creator><dc:creator>Ganesan, Jaya</dc:creator><dc:creator>Raja, J. Emerson</dc:creator><dc:description>&lt;jats:p&gt;Recently, the industry of healthcare started generating a large volume of datasets. If hospitals can employ the data, they could easily predict the outcomes and provide better treatments at early stages with low cost. Here, data analytics (DA) was used to make correct decisions through proper analysis and prediction. However, inappropriate data may lead to flawed analysis and thus yield unacceptable conclusions. Hence, transforming the improper data from the entire data set into useful data is essential. Machine learning (ML) technique was used to overcome the issues due to incomplete data. A new architecture, automatic missing value imputation (AMVI) was developed to predict missing values in the dataset, including data sampling and feature selection. Four prediction models (i.e., logistic regression, support vector machine (SVM), AdaBoost, and random forest algorithms) were selected from the well-known classification. The complete AMVI architecture performance was evaluated using a structured data set obtained from the UCI repository. Accuracy of around 90% was achieved. It was also confirmed from cross-validation that the trained ML model is suitable and not over-fitted. This trained model is developed based on the dataset, which is not dependent on a specific environment. It will train and obtain the outperformed model depending on the data available.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2022-04-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v12i2.pp2001-2013</dc:identifier><dc:identifier>10.11591/ijece.v12i2.pp2001-2013</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 12 No 2 (2022); 2001</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>http://ijece.iaescore.com/index.php/IJECE/article/viewFile/25890/15594</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>