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Improved technique for radar absorbing coatings characterization with rectangular waveguide and numerical modeling

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 12 No. 4 (2022)

DOI
10.11591/ijece.v12i4.pp3827-3837
ISSN
2722-2578, 2088-8708
Published
2022-08-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

For materials characterization, several methods have been developed. Most of them need a sample to be machined prior to testing process. Hence, they are destructive and cannot be used for in-situ radar absorbing coatings testing. This requires employing a suitable measurement technique to extract their electromagnetic properties quickly and accurately. In this paper, the swept frequency of probe reflection technique is proposed for broadband nondestructive radar absorbing coatings characterization using finite flange open-ended rectangular waveguide. The technique is based on the fact that the frequency of measurement is an independent variable of probe’s reflection coefficient by which its data set of selected frequency points can be directly measured in one step by varying the frequency. Finite-difference time-domain (FDTD) method was adopted to calculate probe reflection coefficients at different test conditions. Simple interpolation approximation was employed since they are frequency dependent parameters. Error analysis was numerically performed to evaluate the influences of both flange size and coated material thickness on the accuracy of the measurements, which are carried out on several samples of radar absorbing coatings at X-band to verify the proposed technique. Comparing with the existing methods, the proposed technique simplifies and speeds up measurement process and improves its repeatability and accuracy.

Collaboration network of the authors

2 authors · 1 co-authorship link

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  • University of Kufa
  • Affiliation unknown
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Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

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Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 1 Nov 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Improved technique for radar absorbing coatings characterization with rectangular waveguide and numerical modeling</dc:title><dc:creator>Ameen Hassan, Abdulkadhim</dc:creator><dc:creator>Hameed Saadie, Janan</dc:creator><dc:description>&lt;jats:p&gt;&amp;lt;span&amp;gt;For materials characterization, several methods have been developed. Most of them need a sample to be machined prior to testing process. Hence, they are destructive and cannot be used for in-situ radar absorbing coatings testing. This requires employing a suitable measurement technique to extract their electromagnetic properties quickly and accurately. In this paper, the swept frequency of probe reflection technique is proposed for broadband nondestructive radar absorbing coatings characterization using finite flange open-ended rectangular waveguide. The technique is based on the fact that the frequency of measurement is an independent variable of probe’s reflection coefficient by which its data set of selected frequency points can be directly measured in one step by varying the frequency. Finite-difference time-domain (FDTD) method was adopted to calculate probe reflection coefficients at different test conditions. Simple interpolation approximation was employed since they are frequency dependent parameters. Error analysis was numerically performed to evaluate the influences of both flange size and coated material thickness on the accuracy of the measurements, which are carried out on several samples of radar absorbing coatings at X-band to verify the proposed technique. Comparing with the existing methods, the proposed technique simplifies and speeds up measurement process and improves its repeatability and accuracy.&amp;lt;/span&amp;gt;&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2022-08-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v12i4.pp3827-3837</dc:identifier><dc:identifier>10.11591/ijece.v12i4.pp3827-3837</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 12 No 4 (2022); 3827</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>http://ijece.iaescore.com/index.php/IJECE/article/viewFile/26802/15785</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>