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Super resolution image reconstruction via dual dictionary learning in sparse environment

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 12 No. 5 (2022)

DOI
10.11591/ijece.v12i5.pp4970-4977
ISSN
2722-2578, 2088-8708
Published
2022-10-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Patch-based super resolution is a method in which spatial features from a low-resolution (LR) patch are used as references for the reconstruction of high-resolution (HR) image patches. Sparse representation for each patch is extracted. These coefficients obtained are used to recover HR patch. One dictionary is trained for LR image patches, and another dictionary is trained for HR image patches and both dictionaries are jointly trained. In the proposed method, high frequency (HF) details required are treated as combination of main high frequency (MHF) and residual high frequency (RHF). Hence, dual-dictionary learning is proposed for main dictionary learning and residual dictionary learning. This is required to recover MHF and RHF respectively for recovering finer image details. Experiments are carried out to test the proposed technique on different test images. The results illustrate the efficacy of the proposed algorithm.

Collaboration network of the authors

2 authors · 1 co-authorship link · 1 across different organisations

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  • Jawaharlal Nehru New College of Engineering
  • Siddaganga Institute of Technology
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
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Co-authorOrganisationJoint articles

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Super resolution image reconstruction via dual dictionary learning in sparse environment</dc:title><dc:creator>Kiran Seetharamaswamy, Shashi</dc:creator><dc:creator>Veeranna, Suresh Kaggere</dc:creator><dc:description>&lt;jats:p&gt;&amp;lt;span lang="EN-US"&amp;gt;Patch-based super resolution is a method in which spatial features from a low-resolution (LR) patch are used as references for the reconstruction of high-resolution (HR) image patches. Sparse representation for each patch is extracted. These coefficients obtained are used to recover HR patch. One dictionary is trained for LR image patches, and another dictionary is trained for HR image patches and both dictionaries are jointly trained. In the proposed method, high frequency (HF) details required are treated as combination of main high frequency (MHF) and residual high frequency (RHF). Hence, dual-dictionary learning is proposed for main dictionary learning and residual dictionary learning. This is required to recover MHF and RHF respectively for recovering finer image details. Experiments are carried out to test the proposed technique on different test images. The results illustrate the efficacy of the proposed algorithm.&amp;lt;/span&amp;gt;&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2022-10-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v12i5.pp4970-4977</dc:identifier><dc:identifier>10.11591/ijece.v12i5.pp4970-4977</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 12 No 5 (2022); 4970</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>https://ijece.iaescore.com/index.php/IJECE/article/viewFile/27108/15924</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>