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Ensembling techniques in solar panel quality classification

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 13 No. 5 (2023)

DOI
10.11591/ijece.v13i5.pp5674-5680
ISSN
2722-2578, 2088-8708
Published
2023-10-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Solar panel quality inspection is a time consuming and costly task. This study tries to develop as reliable method for evaluating the panels quality by using ensemble technique based on three machine learning models namely logistic regression, support vector machine and artificial neural network. The data in this study came from infrared camera which were captured in dark room. The panels are supplied with direct current (DC) power while the infrared camera is located perpendicular with panel surface. Dataset is divided into four classes where each class represent for a level of damage percentage. The approach is suitable for systems which has limited resources as well as number of training images which is very popular in reality. Result shows that the proposed method performs with the accuracy is higher than 90%.

Collaboration network of the authors

8 authors · 16 co-authorship links · 9 across different organisations

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  • University of South Australia
  • Can Tho University
  • Ho Chi Minh City International University
  • Hanoi University of Science and Technology
  • National Taiwan University of Science and Technology
  • Affiliation unknown
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
Show as table
Co-authorOrganisationJoint articles
Yousef M. AmerUniversity of South Australia1
Sang‐Heon LeeUniversity of South Australia1
Linh Thi Truc DoanUniversity of South Australia1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Ensembling techniques in solar panel quality classification</dc:title><dc:creator>Luu, Trong Hieu</dc:creator><dc:creator>Ky Phuc, Phan Nguyen</dc:creator><dc:creator>Lam, Tran</dc:creator><dc:creator>Yu, Zhi-qiu</dc:creator><dc:creator>Lam, Van Tinh</dc:creator><dc:description>&lt;jats:p&gt;&amp;lt;p&amp;gt;&amp;lt;span lang="EN-US"&amp;gt;Solar panel quality inspection is a time consuming and costly task. This study tries to develop as reliable method for evaluating the panels quality by using ensemble technique based on three machine learning models namely logistic regression, support vector machine and artificial neural network. The data in this study came from infrared camera which were captured in dark room. The panels are supplied with direct current (DC) power while the infrared camera is located perpendicular with panel surface. Dataset is divided into four classes where each class represent for a level of damage percentage. The approach is suitable for systems which has limited resources as well as number of training images which is very popular in reality. Result shows that the proposed method performs with the accuracy is higher than 90%.&amp;lt;/span&amp;gt;&amp;lt;/p&amp;gt;&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2023-10-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v13i5.pp5674-5680</dc:identifier><dc:identifier>10.11591/ijece.v13i5.pp5674-5680</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 13 No 5 (2023); 5674</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>https://ijece.iaescore.com/index.php/IJECE/article/viewFile/30846/16864</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>