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Deep learning with filtering for defect characterization in pulsed thermography based non-destructive testing

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 14 No. 1 (2024)

DOI
10.11591/ijece.v14i1.pp1027-1040
ISSN
2722-2578, 2088-8708
Published
2024-02-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Pulsed thermography is widely used for non-destructive testing of various materials. The temperature profile obtained after pulse heating is used to characterize the underlying defects in an object. In this paper, the automation of the process of defect visualization and depth quantification in pulsed thermography through various deep learning algorithms is reported. Stainless steel plate with artificial defects is considered for analysis. The raw temperature data is smoothed using moving average, Savitzky-Golay and quadratic regression filters to reduce noise. Thermal signal reconstruction, the conventional method to eliminate noise, is also used for generating filtered datasets. Defect visualization refers to identifying and locating the defects in an image sample and Mask region convolutional neural network (Mask R-CNN) is considered for not just detecting the defects but also locating them on the image. The located defects are utilized for depth estimation using the following networks-multi-layer perceptron (MLP), long short-term memory (LSTM) and gated recurrent units (GRU). The input to the networks is the temperature contrast characteristics which symbolizes the difference in temperature over defective and non-defective areas measured over 250 time points and output of the networks is the estimated depth. The study shows that LSTM based approach provides the least percentage error of 5.5% and is a very suitable approach for automation of defect characterization in pulsed thermography.

Collaboration network of the authors

8 authors · 16 co-authorship links · 9 across different organisations

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  • Ramaiah Institute of Technology
  • Indira Gandhi Centre for Atomic Research
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
Show as table
Co-authorOrganisationJoint articles
V MeghanaRamaiah Institute of Technology1
Megha P. ArakeriRamaiah Institute of Technology1
D. SharathRamaiah Institute of Technology1
Balasubramanian VenkatramanIndira Gandhi Centre for Atomic Research1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
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