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Deep learning based multi disease classification of plant leaves using light weight residual architecture

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 14 No. 4 (2024)

DOI
10.11591/ijece.v14i4.pp4646-4654
ISSN
2722-2578, 2088-8708
Published
2024-08-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

Plant diseases can severely impact crop yields, posing a major risk to worldwide food stability. Prompt and precise identification of these diseases is crucial for early intervention and efficient crop administration. This paper introduces an innovative method for detecting plant leaf diseases using residual networks (ResNets) and the PlantVillage dataset. To develop light weight residual (LWR) architecture, five convolutional layers are interleaved with five max-pooling layers, making up the architecture of ten layers. The number of filters in the convolutional layers is gradually increased from 32 to 64 and up to 512 with a 3×3 kernel. A fully connected layer is the last layer of the network which provides the classification of leaf diseases The LWR architecture is trained and evaluated using the PlantVillage dataset, a broad collection of annotated images. This dataset serves as the basis for the system. The findings of the experiments provide evidence that the suggested system has higher accuracy, sensitivity, and specificity measures. The use of residual networks in LWR architecture improves the capability of the model to acquire complicated representations, which in turn enables a more precise differentiation between healthy and unhealthy plant leaves.

Collaboration network of the authors

3 authors · 3 co-authorship links

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  • Annamalai University
  • Affiliation unknown
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Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Deep learning based multi disease classification of plant leaves using light weight residual architecture</dc:title><dc:creator>Sadhasivam, Muniyandi</dc:creator><dc:creator>Geetha, Manoharan Kalaiselvi</dc:creator><dc:creator>Maria Britto, James Gladson</dc:creator><dc:description>&lt;jats:p&gt;Plant diseases can severely impact crop yields, posing a major risk to worldwide food stability. Prompt and precise identification of these diseases is crucial for early intervention and efficient crop administration. This paper introduces an innovative method for detecting plant leaf diseases using residual networks (ResNets) and the PlantVillage dataset. To develop light weight residual (LWR) architecture, five convolutional layers are interleaved with five max-pooling layers, making up the architecture of ten layers. The number of filters in the convolutional layers is gradually increased from 32 to 64 and up to 512 with a 3×3 kernel. A fully connected layer is the last layer of the network which provides the classification of leaf diseases The LWR architecture is trained and evaluated using the PlantVillage dataset, a broad collection of annotated images. This dataset serves as the basis for the system. The findings of the experiments provide evidence that the suggested system has higher accuracy, sensitivity, and specificity measures. The use of residual networks in LWR architecture improves the capability of the model to acquire complicated representations, which in turn enables a more precise differentiation between healthy and unhealthy plant leaves.&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2024-08-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v14i4.pp4646-4654</dc:identifier><dc:identifier>10.11591/ijece.v14i4.pp4646-4654</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 14 No 4 (2024); 4646</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>https://ijece.iaescore.com/index.php/IJECE/article/viewFile/35116/17604</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>