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Arduino based 74-series integrated circuits testing system at gate level

International Journal of Electrical and Computer Engineering (IJECE) · Vol. 13 No. 5 (2023)

DOI
10.11591/ijece.v13i5.pp4950-4957
ISSN
2722-2578, 2088-8708
Published
2023-10-01
Publisher
Institute of Advanced Engineering and Science
License
creativecommons.org/licenses/by-sa/4.0

Abstract

The goal of this research article is to build and implement a low-cost, user-friendly 74-series logic integrated circuits (ICs) tester that is independent of a computer. Depending on the truth table of the gates and the IC configuration, the logic IC tester will be able to test the operation of the 74 series logic gates (AND, OR, NOR, NAND, XOR) of those ICs. It is feasible to test a range of logic ICs with higher pin widths thanks to the proposed system’s usage of an Arduino Mega platform module as a microcontroller, which provides the ability to connect 54 programmed logic inputs or outputs. The versatility offered by this design and the use of a personal computer allow for the reprograming and updating of the logic IC functional tester. Any 74-series ICs testing outcome will be shown on liquid crystal display (LCD) at the gate level. The logic IC functional tester was successfully constructed and operates flawlessly.

Collaboration network of the authors

13 authors · 23 co-authorship links · 6 across different organisations

Hover or tap a name to highlight its co-authors. Double-click to open the author's page.

  • Tishk International University
  • Universiti Malaysia Pahang Al-Sultan Abdullah
  • University of Mosul
  • Affiliation unknown
  • Different organisations
  • Same organisation
  • Affiliation unknown
  • Thicker line = more joint articles · bigger circle = more articles
Show as table
Co-authorOrganisationJoint articles
Waheb A. JabbarUniversiti Malaysia Pahang Al-Sultan Abdullah2
Yousif AtallaUniversiti Malaysia Pahang Al-Sultan Abdullah2
Abdul Nasir Abd. GhafarAffiliation unknown2
Ahmed MahmoodUniversiti Malaysia Pahang Al-Sultan Abdullah1
Hadi ManapUniversiti Malaysia Pahang Al-Sultan Abdullah1
Firas Natheer Abdul-kadirUniversity of Mosul1
Muhammad Nazmus ShakibAffiliation unknown1
Faris Hassan TahaUniversity of Mosul1
Hussein Mohammed AliTishk International University1
Ghadah A. Al-SakkalTishk International University1

Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.

This record comes from Crossref (what the publisher deposited), because the journal's own OAI-PMH endpoint could not be harvested.

Metadata source: Crossref API (cadangan, berdasarkan ISSN) https://api.crossref.org/journals/2088-8708/works, first harvested 27 Okt 2026, last seen 27 Okt 2026.
Metadata as oai_dc, converted from Crossref
<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/"><dc:title>Arduino based 74-series integrated circuits testing system at gate level</dc:title><dc:creator>Hashim, Yasir</dc:creator><dc:creator>Awni, Marwa</dc:creator><dc:creator>Mufeed, Abdullah</dc:creator><dc:description>&lt;jats:p&gt;&amp;lt;span lang="EN-US"&amp;gt;The goal of this research article is to build and implement a low-cost, user-friendly 74-series logic integrated circuits (ICs) tester that is independent of a computer. Depending on the truth table of the gates and the IC configuration, the logic IC tester will be able to test the operation of the 74 series logic gates (AND, OR, NOR, NAND, XOR) of those ICs. It is feasible to test a range of logic ICs with higher pin widths thanks to the proposed system’s usage of an Arduino Mega platform module as a microcontroller, which provides the ability to connect 54 programmed logic inputs or outputs. The versatility offered by this design and the use of a personal computer allow for the reprograming and updating of the logic IC functional tester. Any 74-series ICs testing outcome will be shown on liquid crystal display (LCD) at the gate level. The logic IC functional tester was successfully constructed and operates flawlessly.&amp;lt;/span&amp;gt;&lt;/jats:p&gt;</dc:description><dc:publisher>Institute of Advanced Engineering and Science</dc:publisher><dc:date>2023-10-01</dc:date><dc:type>info:eu-repo/semantics/article</dc:type><dc:format>application/pdf</dc:format><dc:identifier>https://doi.org/10.11591/ijece.v13i5.pp4950-4957</dc:identifier><dc:identifier>10.11591/ijece.v13i5.pp4950-4957</dc:identifier><dc:source>International Journal of Electrical and Computer Engineering (IJECE); Vol 13 No 5 (2023); 4950</dc:source><dc:source>2722-2578</dc:source><dc:source>2088-8708</dc:source><dc:relation>https://ijece.iaescore.com/index.php/IJECE/article/viewFile/30099/16881</dc:relation><dc:rights>http://creativecommons.org/licenses/by-sa/4.0</dc:rights></oai_dc:dc>