Author profile OpenAlex ID
Yasir Hashim
Tishk International University · Işık University
- Articles in Melola
- 6
- Citations (OpenAlex)
- 81
- Journals
- International Journal of Electrical and Computer Engineering (IJECE)
- ORCID
- 0000-0003-1989-0229
- OpenAlex
- A5031752345
- Name in journal metadata
- Hashim, Yasir
Co-authors
13 authors · 23 co-authorship links · 6 across different organisations
Hover or tap a name to highlight its co-authors. Double-click to open the author's page.
- Tishk International University
- Universiti Malaysia Pahang Al-Sultan Abdullah
- University of Mosul
- Affiliation unknown
- Different organisations
- Same organisation
- Affiliation unknown
- Thicker line = more joint articles · bigger circle = more articles
Show as table
| Co-author | Organisation | Joint articles |
|---|---|---|
| Waheb A. Jabbar | Universiti Malaysia Pahang Al-Sultan Abdullah | 2 |
| Yousif Atalla | Universiti Malaysia Pahang Al-Sultan Abdullah | 2 |
| Abdul Nasir Abd. Ghafar | Affiliation unknown | 2 |
| Ahmed Mahmood | Universiti Malaysia Pahang Al-Sultan Abdullah | 1 |
| Hadi Manap | Universiti Malaysia Pahang Al-Sultan Abdullah | 1 |
| Firas Natheer Abdul-kadir | University of Mosul | 1 |
| Muhammad Nazmus Shakib | Affiliation unknown | 1 |
| Faris Hassan Taha | University of Mosul | 1 |
| Hussein Mohammed Ali | Tishk International University | 1 |
| Ghadah A. Al-Sakkal | Tishk International University | 1 |
| Marwa Awni | Tishk International University | 1 |
| Abdullah Mufeed | Tishk International University | 1 |
Affiliations come from OpenAlex; journal OAI-PMH metadata carries none. Authors without an OpenAlex ID are matched by name, which can merge or split people.
Articles
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Arduino based 74-series integrated circuits testing system at gate level
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Design and implementation of Arduino based robotic arm
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The impact of channel fin width on electrical characteristics of Si-FinFET
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Electrical characterization of si nanowire GAA-TFET based on dimensions downscaling
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Temperature characteristics of FinFET based on channel fin width and working voltage
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Effects of downscaling channel dimensions on electrical characteristics of InAs-FinFET transistor
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